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The reverse recovery characteristics of an SiC superjunction MOSFET with a p-type Schottky diode embedded at the drain side for improved reliability | SpringerLink
The reverse recovery characteristics of an SiC superjunction MOSFET with a p-type Schottky diode embedded at the drain side for improved reliability | SpringerLink
WSe2 Homojunction p–n Diode Formed by Photoinduced Activation of Mid-Gap Defect States in Boron Nitride | ACS Applied Materials & Interfaces
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PDF) Vertical GaN Diode BV Maximization through Rapid TCAD Simulation and ML-enabled Surrogate Model
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A quantum light-emitting diode for the standard telecom window around 1,550 nm | Nature Communications
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Electronics | Free Full-Text | A Novel MOS-Channel Diode Embedded in a SiC Superjunction MOSFET for Enhanced Switching Performance and Superior Short Circuit Ruggedness | HTML
Improved reverse recovery characteristics obtained in 4H‐SiC double‐trench superjunction MOSFET with an integrated p‐type Schottky diode - Kotamraju - 2020 - IET Circuits, Devices & Systems - Wiley Online Library
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The reverse recovery characteristics of an SiC superjunction MOSFET with a p-type Schottky diode embedded at the drain side for improved reliability | SpringerLink
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