The Role of Near-Interface Traps in Modulating the Barrier Height of SiC Schottky Diodes | Semantic Scholar
Couplings of Polarization with Interfacial Deep Trap and Schottky Interface Controlled Ferroelectric Memristive Switching - Chen - 2020 - Advanced Functional Materials - Wiley Online Library
Impact of Interface Traps on Current-Voltage Characteristics of 4H-SiC Schottky-Barrier Diodes | Scientific.Net
Nanomaterials | Free Full-Text | Interface Trap-Induced Temperature Dependent Hysteresis and Mobility in β-Ga2O3 Field-Effect Transistors | HTML
PDF) Interface trap characterization and electrical properties of Au-ZnO nanorod Schottky diodes by conductance and capacitance methods | Omer Nur - Academia.edu
Interface trap distribution, deduced from the high-low frequency C-V... | Download Scientific Diagram
Interface Trap-Induced Nonideality in As-Deposited Ni/4H-SiC Schottky Barrier Diode | Semantic Scholar
Interface engineering of an AlNO/AlGaN/GaN MIS diode induced by PEALD alternate insertion of AlN in Al 2 O 3 - RSC Advances (RSC Publishing) DOI:10.1039/C6RA27190A
Interface Trap States in Organic Photodiodes | Scientific Reports
Reduction of interface traps between poly-Si and SiO2 layers through the dielectric recovery effect during delayed pulse bias st
The effect of the interface trap density on the subthreshold slope of... | Download Scientific Diagram
Couplings of Polarization with Interfacial Deep Trap and Schottky Interface Controlled Ferroelectric Memristive Switching - Chen - 2020 - Advanced Functional Materials - Wiley Online Library
Interface Trap - an overview | ScienceDirect Topics
The applied interface trap density together ionized trap density in... | Download Scientific Diagram
Reducing Interface Traps with High Density Hydrogen Treatment to Increase Passivated Emitter Rear Contact Cell Efficiency | Nanoscale Research Letters | Full Text
Comparison of methods to quantify interface trap densities at dielectric/IIIV semiconductor interfaces
Analysis of interface trap states at Schottky diode by using equivalent circuit modeling: Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena: Vol 25, No 1
Temperature dependence of interface state density distribution determined from conductance–frequency measurements in Ni/n-GaP/Al diode | SpringerLink
Study and Assessment of Defect and Trap Effects on the Current Capabilities of a 4H-SiC-Based Power MOSFET
Interface trap characterization and electrical properties of Au-ZnO nanorod Schottky diodes by conductance and capacitance methods: Journal of Applied Physics: Vol 112, No 6
Reducing Interface Traps with High Density Hydrogen Treatment to Increase Passivated Emitter Rear Contact Cell Efficiency | Nanoscale Research Letters | Full Text
Figure 4 from Mapping of interface traps in high-performance Al2O3/AlGaN/GaN MIS-heterostructures using frequency- and temperature-dependent C-V techniques | Semantic Scholar
Temperature dependence of interface state density distribution determined from conductance–frequency measurements in Ni/n-GaP/Al diode | SpringerLink
Study of Interface Traps in AlGaN/GaN MISHEMTs Using LPCVD SiNx as Gate Dielectric
